MCF > Integration and Test >

Accelerated Life Testing

Scope and Description

This topic page is still under development. Please check back soon!

Best Practices and Lessons Learned

  • -


White Paper
Jeannette Plante

This document offers 4 alternative test methods for electronic parts including; highly accelerated life ... testing (HALT), forward voltage drop tests, highly accelerates stress testing (HAST) burn-in options, and board-level qualification. While these methods are not necessarily the standard procedures that NASA and the DoD follow, this paper will discuss the pros and cons of each.

This presentation provides an overview of the Highly Accelerated Life Testing (HALT) and Highly Accelerated ... Stress Screening (HASS) thermal cycling techniques on commercial off-the-shelf (COTS) electronics boards. It also shows examples and images of thermal cycling performed on PCB boards in a HALT system along with the simulation and analysis results.

Get Involved